RRR test stand - Films on dielectric substrate

thin-film on substrate test stand insert, showing the mounted samples and associated instrumentation, e.g. spring-loaded 4-pin electrical contacts
Picture of the thin-film on substrate test stand insert, showing the mounted samples and associated instrumentation, e.g. spring-loaded 4-pin electrical contacts.

The sample characteristics should comply with :

  1. Resistance between 0.5 Ω and 0.8 Ω at room temperature measured along an 8 mm distance;
  2. Thickness of around 1 mm;
  3. Length comprised between 13 mm and 35 mm, width of 10 mm.

 

Caractéristiques des échantillons:

  1. Résistance entre 0.5 et 0.8 Ω à température ambiante sur une distance de 8 mm ;
  2. Épaisseur de 1 mm ;
  3. Longueur entre 13 et 35 mm, largeur de 10 mm.